In order to reduce the enormous effort and resource consumption for PID tests, in 2013 researchers at Fraunhofer CSP developed an easy-to-use PID test method for silicon solar cells. The method is characterized in particular by the fact that it works without the cost-intensive production of complete solar modules and their testing in large, specially operated climate chambers. Instead, during PID cell test single-cell encapsulated solar cells are tested and exposed to the exact same conditions which are known to cause PID: elevated temperatures and a high electrical potential between glass surface and solar cell. For this purpose, the layer stack structure of a solar module is simulated on the solar cell. Thus, the PID effect can be provoked on a smaller area and the possible degradation can be measured in real time. Furthermore, the effect of different polymer encapsulation films or glasses on the PID resistance of solar modules can be tested as well.